ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF ANNEALED TIN OXIDE THICK FILMS PREPARED BY SCREEN PRINTING TECHNIQUE

Abstract

Thick films of tin oxide (SnO2 ) were prepared by Standard Screen printing method on glass substrates. Thick films of tin oxide were annealed at 500˚C for 5 hrs. in muffle furnace. Electrical characterization was performed in static system. Electrical study was performed with respect to resistance (R), activation energy (∆E) at low and high temperature in terms of Arrhenius plot and temperature coefficient of resistance (TCR). Structural parameters of thick films of tin oxide (SnO2 ) were performed by scanning electron microscopy, energy dispersive spectroscopy, X-ray diffraction, fourier transform infra-red and UV-visible to study surface morphology and surface area, elemental detection in qualitative and quantitative approach, crystalline Phases of films and crystallite size of tin oxide phase material, vibrational and optical modes in terms of absorbance and band gap respectively.